Instrumental Analysis Center
The "Instrumental Analysis Center" was established in the Faculty of Science and College of Science and Engineering in April 2003 with the aim of revitalizing education and research, and strengthening collaboration with industry and the local community. Since then, it has centrally managed a variety of expensive and large analytical equipment that is difficult to install and maintain on a laboratory-by-lab basis, and has promoted collaborative research both inside and outside the university, while also working on research and development aimed at improving analytical technology.
To this day, the "Instrumental Analysis Center" has been a base for disseminating the technology and research results of College of Science and Engineering of our university to the outside world, and has made many achievements in contributing to society and the local community through research and technology guidance, etc. We hope that as an education and research base open to society, it will continue to be utilized and used by many people, and we will also strive to improve the center's unique analytical technology.
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name
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Faculty College of Science and Engineering Instrumental Analysis Center
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Director
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Junichi Shimoyama
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inquiry
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〒252-5258 神奈川県相模原市中央区淵野辺5-10-1
相模原キャンパス碍栋202补 電話： 042-759-6029 |
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link
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Instrumental Analysis Center Leaflet
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The analytical equipment room is lined with large analytical equipment.
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A student operating an electron microscope by himself
Installation Equipment
This center centrally manages the large analytical equipment used on campus, as well as the equipment for pretreatment of analytical samples. Students can operate these devices themselves under the guidance of staff and conduct their own research.
[Main equipment installed]
| photograph | Equipment name and purpose of use |
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Scanning Electron Microscope (SEM)
-Carl Zeiss ULTRA55 The electron beam focused to the nm order scans the sample surface, and the secondary and backscattered electrons are used to observe the morphology of the sample at up to 300,000 times the magnification. The accelerating voltage can be seamlessly adjusted from an ultra-low energy of 100V to 30kV, and at low accelerating voltages in particular, it is possible to observe insulating polymers and ceramics, and a silicon drift type X-ray detector (EDS) is also installed, allowing qualitative analysis and mapping of the constituent elements. |
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Transmission Electron Microscopy (TEM)
-JEM-2100 manufactured by JEOL The internal structure and morphology of solid materials can be observed at magnifications of 2,000 to 1.5 million times, making it possible to evaluate them at the μm to nm level. In particular, lattice images and diffraction patterns obtained by electron diffraction provide atomic-level information on the crystal structure of materials, such as orientation, crystallinity, crystal grain size, and crystal defects. Equipped with a scanning transmission electron microscope (STEM) and an X-ray detector (EDS), it is also possible to perform qualitative analysis of constituent elements and obtain element mapping images. |
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Focused ion beam processing equipment FIB
-Hitachi High-Tech MI4050 This processing and observation device uses Ga ion beams to realize "cutting, stacking, and observing" at the micro- and nano-level. It is equipped with two types of deposition gas guns (C and Pt), a micro-sampling function, a micro-processing function using image data, and a three-dimensional structure analysis function. It is possible to prepare samples for SEM and TEM, fine patterning, nano-mold processing, and the creation of three-dimensional structures. |
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Electron Probe Microanalyzer EPMA
-JEOL JXA-8200S In addition to the morphological observation function of a scanning electron microscope (SEM), it is equipped with four wavelength dispersive (WDS) X-ray spectrometers (five types of analyzing crystals) and can perform elemental analysis from boron (B) to uranium (U). In particular, quantitative analysis that can identify material composition to about 0.1wt% and area analysis (mapping) that visualizes element distribution from the μm range to the cm range are very effective analytical methods. |
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X-ray photoelectron spectroscopy (XPS)
-Kratos Axis-Ultra This is an analytical device that irradiates the surface of a material with X-rays, captures the generated photoelectrons, and examines the element distribution, chemical bond state, and electronic state of the very top surface layer.It is also possible to measure and map the element distribution in the depth direction while etching with Ar. |
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Scanning Probe Microscope (SPM)
-Shimadzu SPM-9700 special model The equipment that observes the surface structure by detecting the various interactions that act between the sample surface and the probe is collectively called a scanning probe microscope (SPM), and this equipment can measure the height difference of the sample surface from the nm to μm level by scanning while detecting the atomic force. The maximum measurement area is about 20 μm x 20 μm, and it is used to measure the roughness of thin film surfaces and visualize three-dimensional shapes. |
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Multipurpose XRD
-Rigaku SmartLab This is a state-of-the-art device newly installed in March 2023. By precisely measuring the diffracted X-ray intensity of the sample, it is possible to identify and quantify the phase of crystalline materials, evaluate crystallinity and orientation, and perform mapping (reciprocal lattice diagrams and pole figures). It is equipped with functions particularly specialized for thin film samples, and is also capable of grazing incidence diffraction measurements (GI-XRD), in-plane diffraction measurements, and reflectance measurements. |
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Laser Raman Spectrometer LRS
-Renishaw inVia Reflex By irradiating a sample with laser light and detecting the Raman scattered light generated from the sample, molecules and compounds can be identified and their chemical state evaluated. The crystallinity and internal stress of materials can also be evaluated. Measurements can be made not only of solids, but also of liquids and gases, and are non-destructive. |
role
The Center has full-time staff on-site who provide centralized management of analytical equipment and support for education and research both within and outside the university.
[Major Roles]
- On-campus education and research support
Analytical technique training for faculty and students College of Science and Engineering
Holding various training sessions and seminars
Analytical Technology Development
?Contribution to the local community
Opening of facilities, science classes for children, hands-on courses, etc.
?Technical guidance for external companies
Practical training based on technical training contract
?Centralized management of large analytical equipment
Maintaining equipment performance, dealing with breakdowns, etc.